This stunning fact is lost, he regrets, on a generation that has supplanted history's sweep with a feeble-minded relativism that holds "all civilisations as somehow equal".
他遗憾地表示，这个惊人的现实在一代人时间里就被一种迟钝的秉持“所有文明平等”的相对主义论取代，并在历史长河中逝去。
The young generation, or nursery, USES a semi-space copying collector, and the old, or tenured, generation USES a concurrent mark sweep collector.
年轻(也称为婴儿(nursery))代使用一个半空间复制收集器，而老年(也称为长存的(tenured))代使用并发的标志扫描收集器。
So as we sweep top left to bottom right, we see the younger generation who is more likely to write blogs and upload videos to YouTube, to an older crowd who are more likely to be content consumers.
从图中左上到右下的趋势，我们可以看出，年轻人更喜欢写博客和上传视频到YouTube，而年长的人更愿意阅读网上的内容。
A method for rapidly determining long generation lifetime under linear voltage sweep was presented.
本文提出了线性电压扫描下长产生寿命的快速测量方法。
Simulate the avalanche circuit in series with PSPICE module, design the high voltage short plus generation circuit by avalanche transistor in series for the sweep deflection circuit of streak camera.
运用PSPICE模型对串联雪崩电路进行了仿真，设计出了用雪崩三极管串联的高压短脉冲产生电路，该电路可以用于条纹相机中的扫描电路。
An experimental method to determine minority carrier generation lifetime from the values of saturation capacitance under two different voltage sweep rates has been presented.
本文建议子一种由两个不同电压扫描率下的饱和电容值确定产生寿命的实验方法。
The experimental results show that for the same MOS capacitor sample the obtained values of generation lifetime from varying association of voltage sweep rates are close each other.
实验结果表明，对于同一个MOS电容器样品，从不同电压扫描率组合得到的产生寿命值基本一致。
On the basis of this, a method of using twice sweep under different voltage sweep rates for determining both bulk generation lifetime and surface generation velocity is proposed.
在此基础上，建议了一种通过两次不同电压扫描率的线性电压扫描来测定半导体的体产生寿命和表面产生速度的方法。
This paper discusses several methods of frequency marker generation and their applications in standard and non-standard sweep analyzers.
本文探讨标准和非标准扫频仪中的几种频率标志的形成方法和适用场合。
A new method of measuring generation lifetime from linear-sweep MOS Ct transient was suggested.
提出了MOS电容线性电压扫描法产生寿命测量的新方法。
A new method of measuring generation lifetime from linear-sweep MOS Ct transient was suggested.
提出了MOS电容线性电压扫描法产生寿命测量的新方法。
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