• Film preparation conditions, film surface morphology and structure of the two kinds of materials are summarized.

    总结了材料条件薄膜表面形态结构以及它们的敏感特性。

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  • The characterization methods for the microstructure, including micropore structure, surface morphology and topography of carbon molecular sieves (CMS), were reviewed in this paper.

    综述了国内外表征分子筛(CMS)微结构包括微孔结构表面形态形貌主要方法

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  • The diameter distribution, surface morphology, thermal properties and structure of the microcapsules were investigated by means of laser particle size analyzer, SEM, DSC and FT-IR, respectively.

    利用激光粒径分布、扫描电镜、差扫描量仪(DSC)傅立叶转换红外光谱仪分别研究胶囊粒径分布、表面形态、热性能和壳结构

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  • The surface of primary particle of CB consists of randomly ranged fine graphite-like crystals with Fullerene structure carbon, and shows rough atomic steps' morphology.

    炭黑原生粒子表面细小石墨状晶体无规排列构成,并存在富勒结构凹凸不平原子台阶形貌。

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  • The chemical structure, surface morphology and separation properties for organics of the membrane were analyzed. The membrane was attempted in high temperature wastewater treating experiment.

    分析了表层化学结构表面形貌低分子有机物的分离性能

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  • The XRD, EXAFS, DSC, SEM and XPS methods for determining and characterizing amorphous structure, surface morphology and active center of the catalysts were introduced.

    介绍了对非晶态合金催化剂非晶结构表面形态活性中心等进行表征定性的XRDEX AFSDSCSEMXPS等方法

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  • The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).

    并且分别利用原子显微镜傅立叶变换红外光谱薄膜进行界面形态和微观结构分析。

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  • The structure, morphology, the element composition and its distribution on the surface of the composite film were then analyzed by means of XRD, om, SEM EDS and XPS.

    利用XRD、OMSEMEDSXPS分析复合薄膜结构表面形貌表面元素组成分布通过紫外光照下甲基橙溶液的光催化降解反应分析了薄膜的光催化活性。

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  • This is ideal optical instrument for micro observation in metallographic structure and surface morphology. It is suitable for research in metallography, mineralogy, precision engineering, etc.

    适用金相组织表面形态显微观察金属学矿物学精密工程学研究理想仪器

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  • The characteristics of the composite partilces, including surface morphology, structure and surface components, were investigated by XRD, SEM, EDS and BET.

    并运用XRDSEMEDSBET等仪器对复合粉末形貌、 物相结构表面成分进行分析

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  • Many theoretical models have been developed to describe the effective evolution of the surface structure and morphology.

    许多理论模型用来描述表面结构形态演变

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  • The x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS)and scanning electronic microscopy (SEM)were employed to analyze the structure, composition and surface morphology of the films .

    x射线衍射XRD)、扫描电镜SEMx光电子能谱(XPS样品进行结构、形貌组分分析

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  • The crystal structure, surface morphology and spectral characteristics of the samples were investigated by X-ray diffraction (XRD), SEM and fluorescence spectrophotometer.

    用XRDSEM荧光分光光度计试样晶体结构表面形貌发光性能进行表征。

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  • Ceria nanoparticles modify the surface morphology and crystal structure of the zinc matrix in correlation with the increase of corrosion resistance.

    纳米氧化颗粒改变涂层表面组织形貌晶体结构,从而提高了涂层的蚀性。

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  • The surface topography and structure and morphology of the coating changed a little after 25 weeks salt fog exposure. As the result, the coating resistance hold high over the period of 25 weeks.

    研究结果表明,单纯老化涂层表面形貌结构形态没有产生明显影响,因此,盐雾老化25周后涂层具有较高电化学阻抗

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  • The surface tension and thermal characteristic of copolymer are analyzed by using surface tension-meter and TA. The structure and transmission morphology are characterized by using IR and TEM.

    采用表面张力仪分析仪共聚物的表面张力热力学性质进行分析,利用红外光谱透射电子显微镜对共聚物的结构形貌进行了表征

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  • The composition, surface morphology and phase structure of the films were tested by EDXA, FSEM, AFM and XRD, respectively.

    通过EDXAFSEMAFMXRD等手段,检测薄膜成分表面截面形貌结构

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  • The structure, surface morphology and the optical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and photoluminescence (PL).

    X 射线衍射XRD)、扫描电镜SEM)、荧光光谱PL)对样品进行结构形貌发光特性的分析。

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  • This paper deals with observation by light and scanning electron microscope on the spore morphology. sporoderm structure and spore-surface ornamental design of Funaria hygrometrica.

    本文报道了光学显微镜扫描电子显微镜葫芦孢子形态、孢壁及纹饰等较详细观察结果。

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  • The surface morphology of corrosion layer, corrosion products, structure and alloy elements of rust layer in natural city atmosphere were studied by metallographic observation, SEM and XRD.

    主要采用金相、扫描电镜、X-射线衍射方法分析探讨了初期腐蚀形貌腐蚀产物合金元素分布。

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  • The morphology, phase, content and special surface area, and pore structure of the samples were characterized using SEM, XRD, EDS and automated surface area and pore size analyzer respectively.

    采用SEMXRDEDS全自动表面孔隙分析仪样品形貌物相含量和比表面、结构进行表征

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  • The effects of the flow rate of oxygen and pulse bias voltage on the structure, deposition rate and the surface morphology of thin film were studied.

    研究流量脉冲偏压薄膜结构沉积速率表面形貌薄膜硬度影响。

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  • The results show that the film surface morphology is reticular porous structure, at different time and termination voltage, there is large difference between membrane surface structure;

    结果表明表面微观形貌网状多孔结构不同时间终止电压下表层结构区别较大

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  • The morphology, crystal structure and composition of catalysts are characterized by XRD, SEM and IR, respectively. The square wave potential technique is used to assess the real surface area.

    采用XRDSEMIR分析技术催化剂晶体结构表面形貌组成进行了表征,并利用方波电位法对电极的真实表观面积进行了测量。

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  • After the graft reaction of ungelatinized starch, the morphology of the copolymers kept the aggregate structure of starch, and vinyl copolymer is grafted on its surface;

    结果表明,合成淀粉共聚物符合预期结构,未糊化的淀粉枝后,聚合物保持团粒结构,表面接枝乙烯基均聚物;

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  • SEM analysis show that morphology of the residue was mostly anomalistic vitreous body that the surface was coarse, poriferous and of lax structure, and therefore it was different from fly ash.

    SEM分析表明,提铝残渣颗粒形貌完全不同于粉煤灰原灰形貌,且为不规则玻璃体颗粒,表面粗糙不平呈多孔、疏松结构

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  • In addition, the surface morphology and crystal structure also affect the films functional groups bioactivity.

    另外,材料表面形貌晶体结构等表面性质会影响其活性化能力。

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  • The structure and surface morphology of the thin films were characterized by means of XRD and SEM.

    X射线衍射,扫描电镜对薄膜进行结构表征。

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  • The structure and surface morphology of the thin films were characterized by means of XRD and SEM.

    X射线衍射,扫描电镜对薄膜进行结构表征。

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