Analysis of the samples suggests there could be 100 times more water in the lunar mantle, the thick rock layer beneath the surface crust, than was previously thought.
经过对于这些样品的研究和分析，科学家们推测在月球地幔层中的水资源是之前预估的将近100倍，这些水就存在厚岩石与地壳层之间。
It analyzed main factors of arising spectrum analysis error which including specimen decarburization layer depth, surface roughness, describing, etc.
分析了引起光谱分析误差的主要因素，如试样脱碳层深度、表面粗糙度、描迹等。
The correlative analysis between organic matter content and salinity of the surface layer showed significant negative correlation in soils with coarse texture; but not as significant in other cases.
对不同质地土壤有机质含量与表层含盐量进行相关分析表明，表层为轻壤时，土壤有机质含量与表层含盐量具有明显的负相关性。
Moreover, illite tends to increase in the surface layer and montmorillonite increases downwards in the content, which is in consistent with the total analysis of the clay.
伊利石在表层有增加的趋势，而蒙脱石向下则有增加的现象，此结果与黏粒的全量分析相一致。
Using SEM with EDX analysis, the composition, microstructure and morphologies of the surface layer were analyzed.
应用SEM电镜分析和能谱分析等方法分析了热浸扩散渗铝层的成分、组织和形貌。
This paper deals with X-ray diffraction profile analysis for the sample with a micro-strain gradient in its surface layer.
本文讨论了样品表面层有微观应变梯度时X射线衍射线形分析的方法。
The theoretical analysis of boundary layer in vane of centrifugal two-phase flow pump may provide a basis for flow drag in vane surface and a theoretical evidence to determine vane curve.
离心式固液两相流泵叶片的边界层的理论分析，可以为分析流体在叶片表面沿程阻力提供基础，进一步也可以为确定叶片型线提供理论依据。
With the progress of technology, several surface analysis techniques are applied in studying coating layer structure.
随着技术的不断进步，一些表面分析技术逐渐地被应用于涂层结构的分析中。
The results of theoretical analysis of two-layer model and real cases showed that using Rayleigh wave to investigate the near-surface structure is feasible.
通过两层模型的理论分析和实例试算，说明利用瑞利面波进行表层结构调查是可行的。
Theory of boundary layer mainly researches the liquid in the boundary layer along the surface of an object, use a method including hydrodynamics and numerical analysis to solve the questions.
边界层理论以在流体中运动物体的表面附近的流体为研究对象，将流体力学和计算力学有机地结合起来以处理相应的问题。
Comparison analysis for antiplane surface motion features between the circular-arc cross-section alluvial valley and the single overburden layer is investigated in details in this paper.
为了更深入地研究了一般圆弧状沉积盆地的出平面地表运动特征，本文与已有的软土单覆盖层解析结果做了对比分析。
Through the analysis on the surface structure by TG and XPS, it has been confirmed that the PMMA layer is presence and it formed chemical bond between the...
通过差热分析(TG)、光电子能谱(XPS)对片状铝粉表面结构进行分析，得出铝粉颗粒表面确实存在PMMA的包覆层且PM MA与铝粉颗粒是以化学键作用相结合。
In the paper, the dam seepage analysis is conducted with no depth contact interface element to simulate layer surface.
本文采用无厚度的接触界面单元模拟层面，进行了坝体的渗流分析。
The analysis of thermal damage layer for the rake face can provide theoretical guidances for confirming the machining allowance of surface grinding.
前刀面热损伤层的定量分析，可以为随动磨削的加工余量提供理论依据。
XFS analysis demonstrated that the content of iron remained unchanged which proved that the above mentioned change occurred only on a very thin surface layer.
XFS分析表明含铁量基本不变，证明上述变化仅发生在很薄的表面层。
Because of the obvious difference of the mechanical properties between the surface layer and its base, the strength analysis with neglecting surface layer will result in error not to be ignored.
由于模具表面层与基体材料的机械性能有明显的差异，忽略表面层进行的模具强度分析将产生不可忽视的误差。
The heat budget analysis shows that the heat loss during night caused by the radiation cooling effect is compensated by heat transferred from the inner ice layer to the ice surface.
冰面热量收支计算表明，夜间冰面辐射冷却损失热量主要由冰层向冰面热量输送来补偿。
Raman and photoluminescence studies of porous silicon were performed using a highly sensitive confocal microprobe Raman system, which allows the z direction layer analysis of the sample surface.
运用高灵敏度的共焦显微拉曼系统研究了多孔硅在纵向的拉曼效应和光致发光的性质。
On the basis of analysis on XPS (X-ray photoelectron spectroscopy) technique the information on electron states of ZnS powder, ZnS thin film surface and internal layer is obtained.
对硫化锌粉料、硫化锌半导体微晶薄膜进行了X射线光电子发射谱剖析。
On the basis of analysis on XPS (X-ray photoelectron spectroscopy) technique the information on electron states of ZnS powder, ZnS thin film surface and internal layer is obtained.
对硫化锌粉料、硫化锌半导体微晶薄膜进行了X射线光电子发射谱剖析。
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