The structure and chemical compositions of the surface oxide film were investigated by XRD and Auger electron spectrometry (AES).
利用X射线衍射(XRD)和俄歇电子衍射(AES)观察了表面膜的化学成分及结构。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Auger electron Spectrscopy (AES) has widespread use in determining the chemical and electronic structure of solid surface (40a).
俄歇电子谱仪广泛地利用来确定固体表面的化学和电子结构(40A)。
The content of this article includes Auger electron emission, surface sensitivity, measurement of Auger electron spectrum, qualitative and quantitative analysis, depth profile etc.
俄歇电子发射，表面灵敏性，俄歇电子谱的测量，定性和定量分析，深度剖析等。
The composition of surface layer of uranium and treated uranium have been analyzed respectively by Auger Electron Spectroscopy (AES).
用俄歇电子谱(aes)分析了铀试样处理前后表层的成分变化。
The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
The surface defects of silver COINS was analysed with auger electron spectroscopy (AES), Scanning electronic microscope (SEM) and energy dispersive spectrum (EDS).
采用扫描电镜、能量色散谱和俄歇电子能谱检测方法，对银币表面缺陷进行了分析。
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