The invention discloses a test circuit for predicting static discharge failure of an integrated circuit and a prediction method thereof.
本发明公开了一种预报集成电路静电放电失效的测试电路及预测方法。
The invention discloses a test circuit for predicting static discharge failure of an integrated circuit and a prediction method thereof.
本发明公开了一种预报集成电路静电放电失效的测试电路及预测方法。
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