For detecting the potential common errors of integrated circuit designs quickly and efficiently, this paper introduces a novel error defection approach based on static analysis.
为快速有效地对集成电路设计中潜在的常见错误进行检测，提出一种基于静态分析的错误检测方法。
For detecting the potential common errors of integrated circuit designs quickly and efficiently, this paper introduces a novel error defection approach based on static analysis.
为快速有效地对集成电路设计中潜在的常见错误进行检测，提出一种基于静态分析的错误检测方法。
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