The anomalous curves of MOS structures in quasi-static capacitance-, oltagc measurements are reported in this paper, and reasons for the generation of these curves are discussed.
本文报导了MOS结构在准静态测试中的异常电容-电压曲线。讨论了它们产生的原因。
The affection of parameter variation of down lead wires and top loading wires on effective height, radiation pattern, input reactance, radiation resistor and static capacitance is discussed.
同时研究了引线及顶线的各项参数变化对天线的有效高度、增益、输入电抗、辐射电阻及静电容的影响。
It is hold that one can increase static capacitance, reduce mode of input reactance and enhance the antenna gain by increasing down lead wires, their distances or lengthening the top loading wires.
研究表明，增加引线数目、引线间距和加长顶线长度均可以增加天线系统的静电容，减小输入电抗的模值，并使天线的增益有所改善。
The distributed static capacitance of the dipole antenna was solved by finite difference method. The influences of the antenna configuration coefficients on the distributed capacitance were analyzed.
首先用差分方法求解了偶极天线上的静态电容分布，并分析了分布电容与天线结构参数之间的关系。
Charge measurement Applications: Capacitance measurements, static charge measurements using a Faraday cup.
各种电荷测量的应用：电容测量、使用法拉第杯的静电电荷测量等。
Coupling capacitance between the heatsink and the devices produces common mode emission, which is considered as a constant calculated by a equation resulting from the static field for a long time.
散热片与器件间的电容耦合是电路产生共模辐射的主要原因之一，其对研究电路的辐射发射特别重要。然而长期以来人们将该电容简化为平板电容，采用静电场推导的电容公式计算。
Coupling capacitance between the heatsink and the devices produces common mode emission, which is considered as a constant calculated by a equation resulting from the static field for a long time.
散热片与器件间的电容耦合是电路产生共模辐射的主要原因之一，其对研究电路的辐射发射特别重要。然而长期以来人们将该电容简化为平板电容，采用静电场推导的电容公式计算。
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