X-ray diffraction (XRD) analysis shows that the as-sputtered film is almost amorphous while new phases V2O5(0 0 1), VO2(0 1 1, 1 -1 0) and V2O3(1 1 3) appear in the annealed films.
由X射线衍射（XRD）分析得知薄膜退火前是非晶的，而在退火后出现V2O5（0 01）和VO2（0 1 1，1 -1 0）以及V2O3（1 13）结晶相。
The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) results indicate that the sputtered film has an amorphous structure.
射线衍射(XRD)、高分辨率透射电镜(HRTEM)和选区电子衍射(SAED)分析表明，该薄膜为非晶态。
The conductivity of sputtered YSZ thin film is high and would be a good solid electrolyte for using in high temperature electrochemistry.
薄膜具有较高的电导率，完全可以作为固体电解质使用。
The conductivity of sputtered YSZ thin film is high and would be a good solid electrolyte for using in high temperature electrochemistry.
薄膜具有较高的电导率，完全可以作为固体电解质使用。
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