In this paper, a method to determine the specific contact resistance of metal-semiconductor contact — circular ring structure method is presented.

本文中提出了一种测量金属-半导体欧姆接触比接触电阻的新方法-圆环结构测试法。

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In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.

本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。

youdao

In this paper, a simple method to measure the specific contact resistance of metal-semiconductor ohmic contact is developed, using the probe heads of the inline four probes.

本文提出一种用直线四探针头测量金属-半导体欧姆接触接触电阻率的简捷方法。

youdao