This paper proposes an approach of automating resolution measurements on shadow mask CRT displays. This new technique is based on conventional double slit method.
本文提出了一种对荫罩式彩显管分辨率进行自动化测试的方法。
Considering the ratio of short in the corner of the channel, the small slit & bar design is suitable for four mask processing, and the corner defect can be avoided by tuning bar size.
考虑到沟道转角处的短路几率问题，小的狭缝与遮挡条尺寸设计更加适合于四次淹没光刻工艺，转角处的缺陷可以通过调整遮挡条的尺寸来避免。
Considering the ratio of short in the corner of the channel, the small slit & bar design is suitable for four mask processing, and the corner defect can be avoided by tuning bar size.
考虑到沟道转角处的短路几率问题，小的狭缝与遮挡条尺寸设计更加适合于四次淹没光刻工艺，转角处的缺陷可以通过调整遮挡条的尺寸来避免。
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