The purpose of this thesis is based on optical scanning systems to probe the inner structures of silicon IC chips by compendious and valid methods.
本论文是以光学扫瞄系统为基础，针对矽晶片内部的结构成像设计出有效方便的架构。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
The distribution of silicon in as-cast white iron was studied using electron probe microanalysis. Effect of silicon on lattice constant of the cementite was also studied using X-ray diffraction.
采用电子探针及X射线衍射仪测定了可锻铸铁白口组织中硅的分布和硅对渗碳体点阵参数的影响。
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