The cells of the silicon rectifiers and the silicon controlled rectifiers are generally destroyed by the internal and external short-circuit currents.
硅整流管及晶闸管常在内、外部短路情况下损坏,这是由于其瞬时温升计算方法错误的缘故。
The cells of the silicon rectifiers and the silicon controlled rectifiers are generally destroyed by the internal and external short-circuit currents.
硅整流管及晶闸管常在内、外部短路情况下损坏,这是由于其瞬时温升计算方法错误的缘故。
应用推荐