The method of testing semiconductor RAM in processes on-line condition is highly different from conventional pattern sensitive method.
联机工作情况下对半导体随机存贮器的故障检测和诊断与一般的图案敏化法有显著的不同。
The method of testing semiconductor RAM in processes on-line condition is highly different from conventional pattern sensitive method.
联机工作情况下对半导体随机存贮器的故障检测和诊断与一般的图案敏化法有显著的不同。
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