The noise components estimation of semiconductors is the precondition of reliability screening of semiconductor devices using noise measurement.
半导体的噪声成分估计是利用噪声进行器件可靠性筛选的前提条件。
The experimental results of semiconductor lasers about the relations between low-frequency noise spectral density and reliability of devices are reported in this paper.
本文给出了半导体激光器的低频电噪声谱密度和器件可靠性关系的实验结果。
The course is also intended to introduce students to noise models for semiconductor devices and to applications of optoelectronic devices to fiber optic communications.
本课程也计划介绍半导体元件的杂讯模型以及光电元件于光纤通讯的应用。
The course is also intended to introduce students to noise models for semiconductor devices and to applications of optoelectronic devices to fiber optic communications.
本课程也计划介绍半导体元件的杂讯模型以及光电元件于光纤通讯的应用。
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