A detection method for obtaining the micro bulk defect size in semiconductive materials by analyzing near infrared laser scattering light distribution is presented.
提出了利用近红外激光散射光强分布分析来检测半导体材料内部微体缺陷的检测方法。
ABSTRACT Barium titanate semiconductive ceramics are the electronics materials used most widely and researched most deeply in functional ceramics.
钛酸钡半导体陶瓷是功能陶瓷中应用最广泛和研究得比较透彻的电子材料。
ABSTRACT Barium titanate semiconductive ceramics are the electronics materials used most widely and researched most deeply in functional ce...
钛酸钡半导体陶瓷是功能陶瓷中应用最广泛和研究得比较透彻的电子材料。
ABSTRACT Barium titanate semiconductive ceramics are the electronics materials used most widely and researched most deeply in functional ce...
钛酸钡半导体陶瓷是功能陶瓷中应用最广泛和研究得比较透彻的电子材料。
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