A two electron gun method and an arrangement whereby the secondary electron emission yield of dielectric materials can be measured are introduced.
本文介绍测量绝缘介质二次电子发射系数的双枪方法，并在动态系统中进行测量。
A two electron gun method and an arrangement whereby the secondary electron emission yield of dielectric materials can be measured are introduced.
本文介绍测量绝缘介质二次电子发射系数的双枪方法，并在动态系统中进行测量。
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