In this thesis, Scanning Force Microscopy (SFM) was used to study the nanoscale electric phenomena of the surface and interface properties of ferroelectric thin films.
本论文利用扫描力显微镜研究了铁电薄膜表面与界面的电势及电畴等微区性质。
It is demonstrated that the detection sensitivity can be greatly improved, and the resolution of SFM (scanning force microscopy) image can reach nanometer order of magnitude.
实验结果表明，检测灵敏度大大提高，扫描力显微(SFM)像的分辨率可达纳米量级。
The researchers analysed the sizes and structures of ash particles using a variety of techniques, such as atomic force microscopy, scanning electron microscopy and X-ray diffraction.
研究人员使用不同的技术研究了火山灰颗粒的尺寸和结构，例如原子力显微镜、电子扫描显微镜和X射线衍射。
Scanning aldehyde group glass slide by atomic force microscopy study the surface shape.
原子力显微镜扫描对醛基化玻片表面形貌进行分析。
The surface morphology and characteristics of the films were characterized by scanning electron microscopy (SEM), X-ray diffraction (XRD), and atomic force microscopy (AFM).
该薄膜的表面形态和特征采用扫描电子显微技术(SEM)，X射线衍射(XRD)以及原子力显微技术(afm)描述。
The structures of RDX/RF aerogel were characterized by atomic force microscopy(AFM), scanning electron microscopy(SEM), X-ray powder diffraction(XRD), and BET method.
用原子力显微镜（AFM），扫描电子显微镜（SEM），X 射线粉末衍射仪（XRD），BET 比表面积分析仪对其结构进行了表征。
Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and atomic force microscopy (AFM) are used to analyze component and surface morphology of the films.
用俄歇电子能谱(AES)、扫描电镜(sem)和原子力显微镜(afm)对薄膜的组成成分和表面形貌进行了分析。
Atomic force microscope (AFM) was invented as another nanoscale microscopy with high resolution based on scanning tunneling microscope (STM) and has extensive application in polymer field.
原子力显微镜(afm)是在扫描隧道显微镜(STM)基础上发明的又一种纳米级高分辨率显微技术，目前已在高分子领域获得了广泛的应用。
The surface composition and structure of membrane were characterized by Fourier transform infrared spectroscopy, scanning electronic microscopy and atomic force microscopy.
红外光谱仪对所制备膜的化学组成进行表征。
The surface composition and structure of membrane were characterized by Fourier transform infrared spectroscopy, scanning electronic microscopy and atomic force microscopy.
红外光谱仪对所制备膜的化学组成进行表征。
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