The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).
通过X射线粉末衍射（XRD）和扫描电子显微镜（SEM）对产物进行了表征。
The prepared product has been characterized by means of X-ray diffraction (XRD) and scanning electron micrography (SEM).
通过X射线粉末衍射（XRD）和扫描电子显微镜（SEM）对产物进行了表征。
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