Chip behaviors were analyzed using scanning electron microscope(SEM), to study the effects of applied load, scan cycles and scanning direction on nanomachining of Al and Cu samples.
应用光学显微镜和扫描电子显微镜对加福煤粉燃烧过程中微观形态的变化规律进行了详细的观察。
Chip behaviors were analyzed using scanning electron microscope(SEM), to study the effects of applied load, scan cycles and scanning direction on nanomachining of Al and Cu samples.
应用光学显微镜和扫描电子显微镜对加福煤粉燃烧过程中微观形态的变化规律进行了详细的观察。
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