Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed.

公开了使用一个或多个测试时钟控制结构的来执行基于扫描测试的方法和计算机可读介质。

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Methods and computer readable media for performing scan-based testing of circuits using one or more test clock control structures are disclosed.

公开了使用一个或多个测试时钟控制结构的来执行基于扫描测试的方法和计算机可读介质。

youdao