This paper proposes a random access scan and test approach, which deals with the compatible issue of scan unit to produce new test group.

提出一种随机存取扫描测试方法，对扫描单元进行相容处理，以形成新的测试集合。

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This paper proposes a random access scan and test approach, which deals with the compatible issue of scan unit to produce new test group.

提出一种随机存取扫描测试方法，对扫描单元进行相容处理，以形成新的测试集合。

youdao