Based on progressively censored sample, the problems of estimating the reliability performance for compound system with electronic components are studied by using Bayes and MLE approaches.
在逐次截尾样本下，研究电子元件混联系统可靠性指标的估计问题。
Based on progressively censored sample, the problems of estimating the reliability performance for compound system with electronic components are studied by using Bayes and MLE approaches.
在逐次截尾样本下，研究电子元件混联系统可靠性指标的估计问题。
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