At the same time, the corrections of probe-effect can be easily done and the effect of some key parameters in measurements can be easily discussed.
同时可以很方便地进行探头修正,并讨论天线平面近场测试中各关键参数对测试结果的影响。
At the same time, the corrections of probe-effect can be easily done and the effect of some key parameters in measurements can be easily discussed.
同时可以很方便地进行探头修正,并讨论天线平面近场测试中各关键参数对测试结果的影响。
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