The polarization interferometry with high resolution and high accuracy is widely used in the measurement of geometrical quantities.
高分辨率、高精确度的偏振干涉测长方法在几何量测量中得到了广泛的应用。
A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry.
本文基于色偏振干涉原理，提出了一种测量石英波片厚度的光谱测量方法。
A spectroscopic method to determine thickness of quartz wave plate is presented. The method is based on chromatic polarization interferometry.
本文基于色偏振干涉原理，提出了一种测量石英波片厚度的光谱测量方法。
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