The structure, surface morphology and the optical properties were characterized by x-ray diffraction (XRD), scanning electron microscopy (SEM) and photoluminescence (PL).
用X 射线衍射（XRD）、扫描电镜（SEM）、荧光光谱（PL）对样品进行结构、形貌和发光特性的分析。
X ray diffraction (XRD), scanning electron microscopy (SEM), high resolution transmission electron microscopy (HRTEM), and photoluminescence (PL) are used to analyze the synthesized GaN nanorods.
用X射线衍射（XRD）、扫描电镜（SEM）、高分辨率透射电镜（HRTEM）和光致发光光谱（PL）对生成的产物进行了分析。
The samples were characterized by X-ray diffraction (XRD), Scanning electronic microscope (SEM), photoluminescence (PL) and X-ray excited luminescence (XEL) spectra.
分别以X-射线衍射（XRD）、扫描电子显微镜（SEM）、光致发光（PL）光谱及X-射线激发的发光（XEL）光谱对样品进行了表征。
Using the testing method of PL spectra, XRD, TEM and SEM, the properties of composite phosphor were identified, including spectrum, structure, granularity and appearance.
利用PL光谱、XRD、TEM、SEM分析手段，对纳米复合荧光粉的光谱、结构、粒度、形貌进行了表征。
The morphology, structure and chemical composition of the films were characterized by the SEM, FTIR, XPS and PL spectra.
薄膜的形貌，结构和化学组成通过SEM、FTIR、XPS以及荧光光谱进行表征。
The samples were characterized by field-emission scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy(EDS) and photoluminescence (PL).
通过扫描电子显微镜（SEM）、能谱分析仪（EDS）和光致发光（PL）测试对样品进行了表征。
The SEM, XRD and PL spectrums studies indicate that all the ZnO samples have good crystal quality and a unified optical properties.
SEM和XRD衍射谱表明衬底对样品晶体结构影响很大，样品上甚至会出现衬底的衍射峰；
We had investigated systematically these samples by XRD, SEM and photoluminescence(PL) and the effect of substrate temperature on the structure and optical properties of these samples.
通过测量X射线衍射（XRD）谱、扫描电镜（SEM）和光致发光（PL）谱，研究了衬底温度改变对薄膜结构和PL的影响。
We had investigated systematically these samples by XRD, SEM and photoluminescence(PL) and the effect of substrate temperature on the structure and optical properties of these samples.
通过测量X射线衍射（XRD）谱、扫描电镜（SEM）和光致发光（PL）谱，研究了衬底温度改变对薄膜结构和PL的影响。
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