We also research on the fault simulation of path delay fault.
我们针对路径延迟故障的故障模拟问题也进行了深入的研究。
The test generation algorithm for non-robust path delay fault in combinational circuits is studied.
研究了组合电路中非鲁棒性路径时滞故障的测试生成算法。
A path delay fault testing generation algorithm for digital circuits based on neural network is proposed because the testing generation for path delay fault in digital circuits is more difficult.
针对数字电路路径时滞故障测试生成较难的问题，提出了基于神经网络的数字电路路径时滞故障测试生成算法。
This paper presents an approach to delay testing with duplicating variable observation points, which provides a high path delay fault coverage by testing a small number of paths.
本文提供了一种使用双倍可变观测点进行时滞测试的方法，保证了只需要测试少量通路就能完成整个电路的时滞测试。
This paper presents an approach to delay testing with duplicating variable observation points, which provides a high path delay fault coverage by testing a small number of paths.
本文提供了一种使用双倍可变观测点进行时滞测试的方法，保证了只需要测试少量通路就能完成整个电路的时滞测试。
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