The parallel test generation technology is an important method to resolve the difficult problem of test on massive circuits.
并行测试技术是解决当今大规模电路测试难题的一个重要手段。
The parallel test generation technology is an important method to resolve the difficult problem of test on massive circuits.
并行测试技术是解决当今大规模电路测试难题的一个重要手段。
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