The components and surface microstructure of the oxide film is analyzed by X-ray and SEM. Its power insulated is measured.
利用X射线，SEM分析了氧化膜的物相组成和表面微观结构，并对其电绝缘性能进行了测试。
The components and surface microstructure of the oxide film is analyzed by X-ray and SEM. Its power insulated is measured.
利用X射线，SEM分析了氧化膜的物相组成和表面微观结构，并对其电绝缘性能进行了测试。
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