In this paper, an instrument for detecting the distribution of the surface total integrated scattering (TIS) of the optical thin films is introduced.
介绍了一种检测光学薄膜表面总积分散射(TIS)分布的总积分散射仪。
In this paper, an instrument for detecting the distribution of the surface total integrated scattering (TIS) of the optical thin films is introduced.
介绍了一种检测光学薄膜表面总积分散射(TIS)分布的总积分散射仪。
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