The method has been successfully used in the system for measuring the 3-d surface topography of diffractive optical elements.
此方法已成功地应用于自行研制的衍射光学元件三维表面形貌测量系统中。
The method has been successfully used in the system for measuring the 3-d surface topography of diffractive optical elements.
此方法已成功地应用于自行研制的衍射光学元件三维表面形貌测量系统中。
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