It may be used to test the on - or off-axis various wavelength wave aberrations, chromatic aberration and other optical performances of various magnification microscopic objective.
该仪器可以测定各种倍率物镜轴上、轴外多种波长的波面像差等光学性能参数。
It may be used to test the on - or off-axis various wavelength wave aberrations, chromatic aberration and other optical performances of various magnification microscopic objective.
该仪器可以测定各种倍率物镜轴上、轴外多种波长的波面像差等光学性能参数。
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