The experimental principle and the method to measure the normal spectral emittance of materials by infrared spectrophotometer and microcomputer system are presented.
本文报道利用红外分光光度计和微机系统，采用二次测量技术，测量材料表面法向光谱发射率的基本原理和测试方法。
The calculative expression of normal spectral emittance is deduced. Some factors which cause the error are discussed Normal spectral emittance curves of several materials are measured.
推导出光谱发射率的计算公式，对引起测量误差的诸因素进行讨论，并实测了几种材料法向光谱发射率曲线。
The calculative expression of normal spectral emittance is deduced. Some factors which cause the error are discussed Normal spectral emittance curves of several materials are measured.
推导出光谱发射率的计算公式，对引起测量误差的诸因素进行讨论，并实测了几种材料法向光谱发射率曲线。
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