Processing time is further decreased by creating multiple scan chains and applying them to multiple pins of the device under test (DUT).
通过产生多个扫描链并将其施加于被测器件(DUT)的多个管脚，可以进一步减少处理时间。
After using compatible compression of multiple scan chains to pretreat the merged test set, modified distance-marking method is used to compress test data.
先采用多扫描链相容压缩预处理总测试集，接着使用改进的距离标记法压缩测试数据。
After using compatible compression of multiple scan chains to pretreat the merged test set, modified distance-marking method is used to compress test data.
先采用多扫描链相容压缩预处理总测试集，接着使用改进的距离标记法压缩测试数据。
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