The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed.
讨论了用辐射-退火法和多元回归分析法对集成电路进行筛选的基本原理和步骤。
The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed.
讨论了用辐射-退火法和多元回归分析法对集成电路进行筛选的基本原理和步骤。
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