In this paper, charge retention characteristics of MNOS memory structures is investigated by a discharge model of the shallower trap.
通过浅在储陷阱的电荷泄漏模型，对MNOS结构的保留特性进行研究。
In this paper, charge retention characteristics of MNOS memory structures is investigated by a discharge model of the shallower trap.
通过浅在储陷阱的电荷泄漏模型，对MNOS结构的保留特性进行研究。
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