The average misorientation of each measured increment throughout the thickness is then determined.
在整个厚度范围内的每个测得增量的平均取向误差，接着就可测得。
The influence of the substrate thickness on cube texture, misorientation Angle and average grain size was studied.
主要研究基带厚度对其立方织构、晶界角分布以及晶粒尺寸的影响。
The influence of the substrate thickness on cube texture, misorientation Angle and average grain size was studied.
主要研究基带厚度对其立方织构、晶界角分布以及晶粒尺寸的影响。
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