The scanning electron microscope provides information on chemical composition by use of X-ray spectrometer attachments.
扫描电子显微镜能利用x射线谱仪的附件来提供化学组份的信息。
The Polycrystalline structure and the phase composition of cordierite kiln furniture are deter-mined by means of X-ray and electron microscope.
利用X-射线衍射分析和电子显微镜分析的结果，确定堇青石窑具的多晶结构和各晶相的含量；
The structure of Li Ca complex grease was studied through IR spectroscopy, X ray diffraction, DTA and electron microscope.
利用红外、X射线衍射、差热和电子显微镜等手段研究了复合锂钙基脂的结构。
The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).
使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。
The surface layers are characterized by means of the optical microscope, X ray diffraction, transmission electronic microscope, and micro hardness testing machine.
用X射线衍射、光镜和透射电镜对表层变形层金相组织、晶粒尺寸、显微硬度进行分析。
Taking the non-coaxial grazing incident KBA X-ray microscope designed as an example, X-ray reflecting from metal surface and single film layer is discussed.
以设计的非共轴掠入射KBAX射线显微镜系统为例，讨论了掠入射下X射线从金属表面和单层膜表面反射的两种情况。
The coating composition, microstructure and phases were investigated by energy dispersive X ray analysis (EDXA), X ray diffraction(XRD), scanning electron microscope(SEM)and image analyzer.
运用能谱技术（EDXA）、X射线衍射仪（XRD）、扫描电子显微镜（SEM）和图像分析仪对涂层成分、显微组织、涂层相结构和组成进行了分析。
The diluting mechanism of organic and inorganic diluents for porcelain clay containing montmorillonite slip have been explored by X-Ray Diffractometer and Transmission Electron Microscope.
本文还利用X -射线衍射仪，透射电镜等测试手段，探讨了有机、无机稀释剂对含蒙脱石瓷砂泥浆的稀释机理。
The products were well-characterized by X-ray diffractometer (XRD) and scanning electron microscope (SEM).
所得产物用X射线衍射仪(XRD)和扫描电子显微镜(SEM)进行了表征。
Employed by optical microscope, scanning electron microscope, microhardness tester and X ray diffraction instrument, the isothermal decomposition process of high nitrogen austenite was investigated.
利用光学显微镜、扫描电镜、显微硬度计及X射线衍射仪分析了高氮奥氏体的等温分解过程。
The crystalline morphology and lattice constants of silica bricks in several status were investigated by the optic microscope, scanning electron microscope and X-ray diffraction.
利用光学显微镜、扫描电镜和X射线衍射仪研究了几种不同状态硅砖的晶体形貌和晶格常数。
The interface between implant and bone were observed with scanning electron microscope (SEM) and X ray energy spectrum analysis (EDAX).
对种植体骨界面作扫描电镜观察、X线能谱分析。
X-ray diffraction and transmission electron microscope experiments indicate the powder sample is amorphous and also show the average particle size and crystallization products.
射线衍射和透射电子显微镜实验不但证实它的非晶性，而且给出它的平均颗粒度大小和晶化产物。
The morphology and crystal structure of solvent induced crystalline PET were studied by X-ray diffraction and scanning electron microscope.
应用X射线衍射和扫描电子显微镜研究了溶剂诱导结晶PET的形态和结晶结构。
A method of identification for low content chrysotile, crocidolite and amosite in brake rubber of bicycle by the united way of polarized light microscope and X-ray diffraction had been established.
本文提出了采用偏光显微镜和X射线衍射仪联合方法鉴定自行车闸皮中低含量的温石棉、铁石棉及青石棉等三种石棉的方法。
METHODS: Study on the microstructure of Indigo Naturals with scanning electron microscope (SEM) and X ray diffractometer (XRD) were carried out.
方法：通过扫描电子显微镜(sem)和x衍射(XRD)方法，对青黛的微观结构进行了研究。
Scanning electron microscope (SEM) and X-ray diffraction (XRD) were used to measure the surface morphology, the crystal microstructure and the distribution of diamond grain in the film.
用扫描电镜(sem)和X射线衍射(XRD)方法检测了复合膜的表面形貌、晶体显微结构和复合膜中金刚石颗粒的分布情况。
In this paper the mechanism and process of light beam surface alloying were investigated by SEM, X-ray diffraction, optical microscope, microhardness etc.
采用SEM、X射线、光学显微镜、显微硬度计等手段研究了高能密度光束表面合金化的机理和工艺。
By using visual examination, scanning electronic microscope, X-ray energy spectrum and metallurgy and chemical analysis, the cause of crack occurred in bellow expansion joint was analyzed.
采用宏观检查、扫描电镜、X射线能谱、金相分析及化学分析等方法，对金属波纹膨胀节开裂的原因进行了分析。
Optical metallographic microscope, micro-hardness tester, electron microprobe and X-ray diffraction analysis were applied to explore the process of intermediate temperature tempering transformation.
利用光学金相显微镜、显微硬度计、电子探针及X射线衍射分析仪初步探索其中温回火转变过程。
Reflectivity of Cu is 0.021 and that of single film layer is 0.049, thus KBA X-ray microscope is made of single film layer.
无氧铜的反射率为0.021，单层膜的反射率为0.049，因此KBAX射线显微镜可采用镀单层膜的方法加工。
Macro examination, metallographic microscope, microhardness tester and X ray diffractometer were utilized to study the failure reasons for connecting rode bearing bush of automobile engine.
采用宏微观检验、显微硬度测定、X射线衍射等方法对汽车发动机连杆轴瓦的失效进行了分析。
The structural and magnetic properties of the granular film are studied by atomic force microscope, energy dispersion X-ray spectrum, X-ray diffraction, and alternating gradient magnetometer.
利用原子力显微镜、能量散射X射线谱、X射线衍射和交变梯度磁强计研究了该颗粒膜材料的结构和磁学性质。
Transmission electron microscope (TEM), Raman spectroscopy and X ray diffraction (XRD) were used to investigate the lattice structures, phonon properties of the samples.
通过透射电境、X光衍射和拉曼散射对纳米晶的晶格结构和声子特性进行了研究。
And polarizing microscope, wide-angle X-ray diffraction (WAXD) and differential scanning calorimeter (DSC) were used to study the crystalline of PLA membranes prepared at different conditions.
并且借助于偏光显微镜、广角X-射线衍射仪（WAXD）和差式扫描量热仪（DSC）研究了不同成膜条件下膜的结晶情况。
The product was analyzed by using X-ray diffractometer and electronic microscope and the dispersity in organic solvents was determined.
对产品进行了X-射线衍射和电镜分析，并检测了在有机溶剂中的分散性。
In this paper, Korean pine carbonization samples were analyzed at different heating temperatures by scanning electron microscope (SEM) and X-ray energy dispersive analysis (EDS).
对模拟火灾不同受热温度条件下的炭化红松样品，进行了扫描电镜(sem)和x -射线能谱仪(EDS)分析。
A soft X-ray TV microscope for nondestructive testing has been developed. The testing results of some samples with the system are given.
介绍一种用于无损检测的软x射线电视显微镜，并给出了用该设备检测几种不同类型样品的结果。
They have been characterized respectively by transition electronic microscope (TEM), X-ray powder diffraction (XRD), field induced surface photovoltage spectrum (FISPS).
对其进行了透射电镜(tem)、X射线粉末衍射(XRD)，场诱导表面光电压谱表征(FISPS)。
The morphology, structure, and photoluminescence(PL) of the phosphors were investigated by transmission electron microscope(TEM), X-ray diffraction(XRD), emission spectra, and decay time.
以X射线衍射（XRD）、透射电子显微镜（TEM）、发射光谱和衰减时间谱等手段表征材料性能。
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