The whole experiment demonstrates that monitoring the quality of CCD process and analysing failure of the device by microelectronic test patterns is practical and reliable.
整个实验表明，用微电子测试图形监控CCD工艺、分析器件失效，是可行可靠的。
The whole experiment demonstrates that monitoring the quality of CCD process and analysing failure of the device by microelectronic test patterns is practical and reliable.
整个实验表明，用微电子测试图形监控CCD工艺、分析器件失效，是可行可靠的。
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