The BIST controller can not only perform traditional memory test algorithms but also generates test patterns required for the logic part.
BIST控制器不仅可以执行传统的存储器测试算法,而且可以生成用于逻辑模块的测试向量。
The BIST controller can not only perform traditional memory test algorithms but also generates test patterns required for the logic part.
BIST控制器不仅可以执行传统的存储器测试算法,而且可以生成用于逻辑模块的测试向量。
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