Under time and area constraint, this method studies the testability and low power by way of high-level scheduling and module allocating.

该方法在时间和面积约束下，通过高层次调度和模块分配，对可测性和低功耗问题进行研究。

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Under time and area constraint, this method studies the testability and low power by way of high-level scheduling and module allocating.

该方法在时间和面积约束下，通过高层次调度和模块分配，对可测性和低功耗问题进行研究。

youdao