The polarized light interferometer is also a kind of unbalanced interferometer which can convert the Bragg wavelength shifts into interferometer phase shifts.
偏振光干涉仪也是一种能将布拉格波长移动转化为干涉相位变化的非平衡干涉仪。
In this thesis, a technique of scanning white-light interferometer in Michelson configuration is employed to measure and analyze the characteristics of different types of oil-film on water surface.
本文基于迈克尔逊干涉原理，通过扫描白光干涉装置对不同油品在水面形成的油膜的特性进行了测量和分析。
The light is resolved by prisms, gratings, or by an interferometer.
光线用棱镜、光栅或干涉仪分解。
In order to solve these questions we study the automatic adjustment of light intension and vibration-resistant of interferometer in this paper.
为了解决上述问题，本文着重对光强的自动调节和干涉仪抗振进行了研究。
In sinusoidal phase modulating laser diode interferometer, the main error source is the variation in output light intensity of light source.
在半导体激光正弦相位调制干涉仪中，光源输出光强的变化是测量误差的主要来源。
In addition to alternating phase difference between two aims of interferometer, the intensity of light of the interference fringes will vary in the same frequency, which is called as phase modulation.
当两相干光附加一按固定频率变化的相位差时，其干涉条纹的光强将随之交变，即为相位调制干涉。
Spectrophotometers for recording spectra consist of a suitable light source, monochromator or interferometer and detector.
记录光谱的分光光度计由合适的光源、单色器或干涉器和检测器组成。
To measure the light wavelength by Michelson interferometer is a classic physics experiment.
迈克尔逊干涉仪测量光波波长是经典的近代物理实验之一。
The system mainly consists of wide-band light source, fiber Bragg grating, unbalanced Mach-Zehnder interferometer, and data acquisition and processing components.
系统主要由宽带光源、光纤光栅、非平衡马赫-曾德干涉仪、数据采集与处理等部分组成。
The principle of the white-light fiber interferometer is introduced, and one-dimensional deformation experiment is designed.
本文介绍了光纤白光干涉仪的工作原理，设计了一维形变实验。
Laser interferometer and grating of modulation light are used in the measuring system and the measuring data is processed by microcomputer.
该装置的测量系统采用了激光干涉仪和光调制光栅，并由微型机进行数据处理。
With using absolute optical interferometer for measuring length of block gauge, it is necessary to solve the problem of phase jump for reflecting of light on its surface.
在用绝对光波干涉法测量量块长度时，必须解决光在量块表面反射时的位相跃变问题。
The second is a coded mask photographic interferometer using white light. It can be used for measuring strongly varied phase obj...
第二种是用白光的(编码板)照相干涉法。它们能用于强变化位相体的测量。
The light is resolved by prisms, gratings, or by an interferometer.
本光栅干涉仪用光栅作为分束器，使双光束发生干涉。
A dispersive white-light spectral interferometer for precise measurements of the phase properties of multilayer thin film structures is built.
本文搭建了一个用于精确测试光学薄膜位相特性的色散式白光频谱干涉仪。
When wave length scanning is carried out, three output white light interference spectrums of the interferometer and a transmission spectrum of the etalon and the fiber grating are probed.
扫描波长时，探测干涉仪的三路输出白光干涉光谱，以及标准具和光纤光栅的透射谱。
The system is based on Michelson interferometer. It USES a fiber laser with narrow linewidth as light source, and adopts homodyne demodulation with phase generated carrier scheme to restore signal.
该系统基于迈克尔逊干涉仪结构，以窄线宽光纤激光器为光源，采用相位载波零差解调方案实现信号的还原。
The dual-frequency laser as a light source takes a key element in the interferometer.
本文提出一种新型中频差双频激光器——磁致旋光-塞曼双频激光器。
This paper introduces a new method of measuring the refractive index of parallel-sided transparent material with a Michelson interferometer-the minimum visibility of sodium light fringes.
介绍一种用迈克耳逊干涉仪测量平面平行透明物体折射率的新方法。
With the increase of demand for thin film structures with specific phase properties, this white-light spectral interferometer can play an important role in future thin film industry.
随着对于薄膜位相调制特性要求的提高，该系统将可望在未来的薄膜工业中扮演比较重要的角色。
The scattered light from the first laser is collected and analyzed with an interferometer to demodulate the surface vibrations caused by the return echoes of the ultrasound at the surface of the part.
由表面的超声表面位移使检测激光束散射以产生经相位调制的光；收集经相位调制的光；对经相位调制的光进行处理来获得代表表面处的超声表面位移的数据；
The scattered light from the first laser is collected and analyzed with an interferometer to demodulate the surface vibrations caused by the return echoes of the ultrasound at the surface of the part.
由表面的超声表面位移使检测激光束散射以产生经相位调制的光；收集经相位调制的光；对经相位调制的光进行处理来获得代表表面处的超声表面位移的数据；
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