The incident Angle dependences of the cross sections for single event upset and single event latchup are presented.
获得了单粒子翻转和单粒子闭锁截面与入射角度的依赖关系。
Latchup, matching and parasitic are considered to make sure the connection lines shortest and the cross points least, finally the chip area is estimated.
在放置器件时考虑可能出现的拴锁、匹配和寄生，使其之间的连线最短、交叉最少，并对芯片面积进行了估算。
Latchup, matching and parasitic are considered to make sure the connection lines shortest and the cross points least, finally the chip area is estimated.
在放置器件时考虑可能出现的拴锁、匹配和寄生，使其之间的连线最短、交叉最少，并对芯片面积进行了估算。
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