A method of determining an optimum set of testable components in the fault diagnosis of analog linear circuits under K faults hypothesis is presented in the paper.
本文提出了在模拟线性电路故障诊断中k故障假设下一组最优可测试成份确定的方法。
A method of determining an optimum set of testable components in the fault diagnosis of analog linear circuits under K faults hypothesis is presented in the paper.
本文提出了在模拟线性电路故障诊断中k故障假设下一组最优可测试成份确定的方法。
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