If there was a problem with the chip, you could probe the metal directly to watch the circuitry, and, with a focused-ion-beam system, you could even rewire it.

如果芯片有问题，应该直接研究金属层来察看电路，而对于聚焦离子束系统则应该重新布线。

youdao

If there was a problem with the chip, you could probe the metal directly to watch the circuitry, and, with a focused-ion-beam system, you could even rewire it.

如果芯片有问题，应该直接研究金属层来察看电路，而对于聚焦离子束系统则应该重新布线。

youdao