Tip: to test if the small pattern is integrated in the background pattern, you can make its layer invisible and then visible again.
提示：测试对齐背景图案的小图案，可以使这一层隐藏，然后再次可见。
The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.
本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。
The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.
本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。
应用推荐