ICT (Integrated circuit test) is a test during which we measure value of components, resistance, capacity, open, shorts tracks etc. on the assembled product.
集合电路测试(ICT)是用于获取集成产品的电容，电阻，功率，开合，短路等状态值的实验。
Space Micro received application-specific integrated circuit (ASIC) devices in March from their silicon foundry and are under test and evaluation.
这种专用集成电路，目前正处于测试和评估阶段。
During the testing of the integrated circuit (404), it communicates in the wafer test mode.
在集成电路(404)的测试过程中，它在晶片测试模式下通信。
As the integrated circuit design has stepped into the deep ultra-submicron stage, the complexity of the circuit increases continually, chip test faces very huge challenge.
随着集成电路设计进入超深亚微米阶段，电路复杂度不断提高，芯片测试面临着巨大的挑战。
Then, the integrated and embedded self-test circuit was designed based on single chip ADUC812 and nixie tube etc. The self-test software was programmed based on assembly language.
采用ADUC812单片机、数码管等，设计了集成化、嵌入式的自检测系统硬件电路，并利用汇编语言编程实现了机内自检测软件。
In order to reducing the cost of test and improving the reliability of integrated circuit, current based test method arises at the historic moment.
为了降低测试成本并且提高集成电路的可靠性，电流测试应运而生。
This article mainly introduces applications of X - ray technology in the fields of hybrid integrated circuit failure analysis, DPA, and screening test.
本文主要介绍X射线透视技术在混合集成电路的失效分析、DPA以及筛选领域中的应用。
The invention discloses a test circuit for predicting static discharge failure of an integrated circuit and a prediction method thereof.
本发明公开了一种预报集成电路静电放电失效的测试电路及预测方法。
This article briefly describes the typical application of KJ series of integrated circuit into controllable rectifier and precautions for test trial.
本文简要介绍了KJ系列集成电路在碲电解可控硅整流器触发控制板上的典型应用及调试的注意事项。
The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.
本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。
Aiming at the mixed-signal circuit testing, an integrated built-in self test (BIST) architecture for testing on-chip high speed ADC was presented.
针对混合信号电路的测试问题，提出了一种内建自测试(BIST)结构，分析并给出了如何利用该结构来计算片上高速模数转换器(adc)的静态参数。
This article introduces the MCS51/96 monolithic integrated circuit teaching test equipment, and analyses(several) essential technologies.
介绍了自行研制的MCS 51/96单片机教学实验装置，并对其中的几个关键技术做了一定的分析研究。
This article introduces the MCS51/96 monolithic integrated circuit teaching test equipment, and analyses(several) essential technologies.
介绍了自行研制的MCS 51/96单片机教学实验装置，并对其中的几个关键技术做了一定的分析研究。
应用推荐