We got the infrared spectra by The Fourier Transform Infrared (FTIR) spectroscope and measured the thin films' photoconductivity using Coplanar Aluminum Plating Electrode methods.
应用傅立叶红外仪测量了薄膜的红外谱，用共面蒸铝电极法测量了薄膜的光电导。
The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).
并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。
The surface morphology and chemical structure of the film are characterized by Atomic Force Microscope (AFM) and Fourier Transform Infrared Spectroscope (FTIR).
并且分别利用原子力显微镜和傅立叶变换红外光谱对薄膜进行界面形态和微观结构分析。
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