In this paper, a scheme is presented, in which an infinite length's LFSR with non maximum cycle sequence is used as a built-in test generator in digital systems.
本文介绍了一种使用非最长周期序列的非定长线性反馈移位寄存器作为数字系统内部测试生成器的方案，并给出了设计这种测试生成器的设计过程和算法。
In this paper, a scheme is presented, in which an infinite length's LFSR with non maximum cycle sequence is used as a built-in test generator in digital systems.
本文介绍了一种使用非最长周期序列的非定长线性反馈移位寄存器作为数字系统内部测试生成器的方案，并给出了设计这种测试生成器的设计过程和算法。
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