• The effect of grain boundary structure on secondary working embrittlement (SWE) of IF steels was studied by electron back-scatter diffraction (EBSD) and TEM.

    采用电子背散射衍射EBSD)技术 TEM技术对IF二次加工脆性晶界结构之间关系进行了研究。

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  • The individual crystal units comprising the aggregate structure where the crystalline orientation does not change. The grain boundary is where these individual crystal units meet.

    构成总的结构单个晶体个体晶体方位没有发生变化晶界这些单个的晶体单位相遇的界限。

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  • Imaging with scanning transmission electron microscopy showed that the atomic grain-boundary structure had dislocations that had very similar arrangement.

    扫描电子显微镜图像显示两种晶界原子结构中的位排列十分相似

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  • The results show that the properties of grain-boundary states in recrystallized polysilicon films sharply depends on the crystallographic structure of the films.

    实验结果表明多晶硅薄膜晶粒界面和硅离子注入后多晶硅薄膜晶粒组成结构是密切相关的。

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  • The results show that the films with dense and amorphous structure and lower grain boundary resistance were deposited at room temperature.

    研究结果表明,室温下沉积薄膜颗粒致密非晶相结构,晶界电阻较小

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  • The calcite layer and aragonite layers are multi-scale structure , and a small quantity of organic matrix distributes mainly in their grain boundary.

    贝壳中的方解石和文石层均呈多级超微结构,微量有机质晶界和晶内呈不连续分布

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  • The results show that oxide inclusion in grain boundary and structure defects from casting and forging process are the main reasons for failure of the copper sleeve.

    结果表明晶界氧化夹杂铸造锻造造成组织缺陷引起结晶器套快速失效主要原因

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  • The glass has an amorphous structure and exists at the composite phase interface and ceramic grain boundary.

    玻璃料以无定形态存在于复合材料中的相陶瓷晶界上。

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  • Their piezoelectric and dielectric properties relate to the structure characters such as suitable tetragonality, moderate grain-size and Mn ions distributed on the grain boundary.

    通过三个体系的比较,PLMN -PZT四元系材料适中的四方度、晶粒尺寸晶界处析出是它具有良好压电介电性能结构基础。

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  • Their piezoelectric and dielectric properties relate to the structure characters such as suitable tetragonality, moderate grain-size and Mn ions distributed on the grain boundary.

    通过三个体系的比较,PLMN -PZT四元系材料适中的四方度、晶粒尺寸晶界处析出是它具有良好压电介电性能结构基础。

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