This paper propose a functional fault for delay faults in combinational circuits and describe a functional test generation procedure based on this model.
提出一种用于测试组合电路中延迟故障的新功能故障模型，讨论该模型的功能测试生成。
This paper propose a functional fault for delay faults in combinational circuits and describe a functional test generation procedure based on this model.
提出一种用于测试组合电路中延迟故障的新功能故障模型，讨论该模型的功能测试生成。
应用推荐